DICC (Delta) Supply-Current Change
JEDEC – no definition offered
TI – The increase in supply current for each input that is at one of the specified TTL voltage levels, rather than 0 V or VCC.
If n inputs are at voltages other than 0 V or VCC, the increase in supply current will
be n x ICC. The change in supply
current (ICC)
is tested by applying the specified VCC
level, setting one input lower than VCC (for example, VCC
– 0.6 V for LVC and ALVC devices) and all other inputs the
same as the ICC test, at 0 V or VCC, then measuring the current into the
device (see the Figure below). The outputs of the device are open,
as well. The DICC specification
typically is useful only on CMOS products that are designed to be
operated at 5 V or 3.3 V because its purpose is to provide
information about the supply-current performance of the CMOS device
when driven by 5-V TTL signal levels.
Helpful Hint:
Use the DICC specification as a reference when driving a CMOS device input with a TTL output driver.
Helpful Hint:
The DICC specification also demonstrates the high currents that can occur if VIH and VIL recommended operating conditions are not observed.